Application of Preselection of Test Subsequences in Sequential Test Generation for Functional Delay Faults
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Electronics and Electrical Engineering
سال: 2012
ISSN: 2029-5731,1392-1215
DOI: 10.5755/j01.eee.118.2.1179